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Category Archives: Test & Measurement

Are they crazy or in love?

Tuesday, June 19, 2012

You have to ask yourself why these individuals would choose to work in the test and measurement field.

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IMS2012 exhibitions start today – here are some devices to see

Tuesday, June 19, 2012

By Christina Nickolas Here is a brief taste of what exhibitors plan to showcase on the IMS2012 floor. AWR (booth#1514) will be showcasing the Analyst – 3D EM technology for bumps, bond wires, tapered vias and more – as well as its latest release of Microwave Office™, Visual System Simulator™, AXIEM® and Analog Office® for [...]

Also filed in Electromechanicals, ICs & Discrete Semis, Industry News, Opinion, Product News, Software/Development Tools, Technology News, Trade Shows | Tagged | Comments (0)

Heads up: see what Agilent will be exhibiting at IMS

Friday, June 15, 2012

By Christina Nickolas Agilent Technologies (booth#1015) will demonstrate its newest design and test products for advanced RF and microwave research, development and manufacturing. At their booth you can see the following solutions: o            the latest releases of ADS, EMPro, GoldenGate, SystemVue, Genesys and IC-CAP, addressing MMIC/RF Module, RFIC and system design challenges. o            their nonlinear [...]

Also filed in ICs & Discrete Semis, Industry News, Software/Development Tools, Technology News, Trade Shows | | Comments (0)

Simulating Photovoltaic Panels

Friday, April 20, 2012

When designing a device with max power point tracking (MPPT) capability such as a solar inverter or power optimizer you are going to need to simulate the output of a PV panel or panels to test your MPPT design.  This is necessary to verify your design and provide an accurate efficiency spec under different of lighting [...]

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Understanding Ground Loop Error

Sunday, April 8, 2012

A true ground potential is something that only exists on paper or in simulations. In the real world there is no such thing as a true ground which in test and measurement leads to ground loop errors. Ground loops present problems when measuring low level signals such as thermocouple measurements. When measuring voltages in circuits where [...]

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Agilent challenges NI’s recent claims about the PXA

Thursday, August 11, 2011

After National Instruments introduced it’s PXIe-5665 vector signal analyzer (VSA, see “PXI VSA covers 14 GHz with top specs“) at NI Week (on Tuesday, Aug.2, presented by Jim Bains and Raajit Laal, “NI 14 GHz Vector Signal Analyzer”) and posted the video,“Head to Head: NI PXIe-5665 Versus Traditional Boxed Instruments” on YouTube, Agilent Technologies raised [...]

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National Instruments introduces 20 new products

Wednesday, August 3, 2011

The annual get together at NI week is in full swing right now in Austin with more than 3,300 attendees. An update of the ubiquitous LabVIEW is front and center, along with the new PXIe-5665 three-stage RF vector signal analyzer with 14-GHz frequency response that is said to deliver the best phase-noise and dynamic-range performance [...]

Also filed in Industry News, Software/Development Tools, Technology News | | Comments (1)